Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461502152
Size: 72.27 MB
Format: PDF, Docs
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.

Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461304911
Size: 47.49 MB
Format: PDF, Docs
View: 5178
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In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA.

Physical Principles Of Electron Microscopy

Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Size: 58.15 MB
Format: PDF, ePub
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At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Practical Scanning Electron Microscopy

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461344220
Size: 54.16 MB
Format: PDF, ePub, Mobi
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In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States.

Scanning Electron Microscope Optics And Spectrometers

Author: Anjam Khursheed
Publisher: World Scientific
ISBN: 9812836675
Size: 20.57 MB
Format: PDF
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This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research.

X Ray Photoelectron Spectroscopy

Author: Paul van der Heide
Publisher: John Wiley & Sons
ISBN: 1118162900
Size: 36.43 MB
Format: PDF, ePub, Mobi
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This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field.

A Handbook Of Silicate Rock Analysis

Author: P.J. Potts
Publisher: Springer Science & Business Media
ISBN: 940153988X
Size: 30.88 MB
Format: PDF, Mobi
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In this book, these characteristics techniques is now commonly used for silicate rock analysis, have been described within a framework of practical ana lytical aplications, especially for the routine multi-element including some that ...

Electron Backscatter Diffraction In Materials Science

Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 1475732058
Size: 76.65 MB
Format: PDF, ePub
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This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic.