Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461502152
Size: 50.84 MB
Format: PDF, Mobi
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.

Physical Principles Of Electron Microscopy

Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Size: 73.62 MB
Format: PDF, Docs
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At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Scanning Electron Microscope Optics And Spectrometers

Author: Anjam Khursheed
Publisher: World Scientific
ISBN: 9812836675
Size: 13.11 MB
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This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research.

Electron Energy Loss Spectroscopy In The Electron Microscope

Author: R.F. Egerton
Publisher: Springer Science & Business Media
ISBN: 1461568870
Size: 70.71 MB
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In writing this book, I have tried to gather together relevant information from these various fields. Chapter 1 begins at an elementary level; readers with some experience in EELS will be familiar with the content of the first two sections.

Electron Backscatter Diffraction In Materials Science

Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 0387881360
Size: 15.77 MB
Format: PDF, ePub, Mobi
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The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter ...